Time-of-Flight SIMS has emerged as an important elemental, chemical, and molecular imaging technique for many areas of advanced technology and research because of its unique combination of sensitivity, spatial resolution and molecular specificity. The PHI TRIFT V nanoTOF Provides Unique Insights into Materials Development, Failure Analysis and Basic Medical Research.
X-ray photoelectron spectroscopy (XPS) is the most widely used surface analysis technique and has many well established industrial and research applications. XPS provides quantitative elemental and chemical state information from surfaces and thin film structures. XPS is applied to a diverse range of materials applications including: polymers, metals, catalysts, thin films, photovoltaics, batteries, wear coatings, nanomaterials, semiconductor devices, magnetic storage media, display technology, and biomedical devices.
Atomic Force Microscopy (AFM) provides nano-meter imaging and pico-Newtown force measurement on almost all kind of sample surfaces in both air and liquids. On top of conventional tapping and contact modes, Bruker Multimode 8 AFM also comes with patterned ScanAsyst PeakForce tapping mode provides highest resolution mapping of nanomechanical properties from extremely soft materials (~1 kPa) to hard metals (100 GPa) simultaneously with surface imaging.