Bruker Multimode 8 Atomic Force Microscope

The Bruker MultiMode 8 AFM provides nano-meter surface topography imaging and pico-Newtown surface force measurement in both air and liquids. Bruker’s exclusive ScanAsyst mode offers automatic image optimization for faster, more consistent results. It will continuously adjust scan rate, setpoint and gains to obtain the highest quality image. Imaging in fluid has never been easier. There’s no need for cantilever tuning and ScanAsyst continuously monitors the tip-sample interaction force, thereby eliminating setpoint drift. PeakForce QNM enables direct mapping of nanomechanical properties, including elastic modulus, adhesion and dissipation, at high resolution and normal scan rates. The data channels are quantitative and unambiguous, unlike conventional phase imaging and some competing multi-frequency techniques.


  • Contact, Tapping, and ScanAsyst imaging modes
  • Normal and lateral forces measurement
  • Measurement in air or liquids
  • AFM resolution: < 5 nm
  • No additional sample treatment needed
  • Auto functions
  • Chemical-electric measurement module
  • Temperature control stage (-10oC- 150oC)


  • Tai-De Li, Ph.D.
    Manager, Surface Science Facility
    Research Associate Professor, Nanoscience Initiative

Manufacturer / Model

Bruker / MultiMode 8 AFM


Chen Lab, Surface Science Facility