The Surface Science Facility at the CUNY ASRC offers cutting-edge surface analyzing instruments for academic and industrial researchers. The facility currently has three core instruments: (1) X-ray photoelectron spectroscopy (XPS) to measure the elemental composition, empirical formula, chemical state, and electronic state of sample surface; (2) time-of-flight secondary ion mass spectrometer (TOF-SIMS) to perform elemental trace measurements of the top atomic layers of the sample surface; and (3) atomic force microscopy (AFM) to image surface topography and stiffness with nanometer resolution in air and liquid environments. Typical applications include the research fields of semiconductor devices, synthetic chemistry, nano-materials, bio-materials, 2D materials, surface coating, and biology.
To view a full list of the instruments available in the Surface Science Facility, please click here.
We encourage researchers to get trained to become a user of the facility. Click here to find instructions and the forms necessary to become a user. A full list of instrument user rates can be found here.
To enquire about any of the instruments, availability, training, or for remote measurement service, please contact Surface Science Facility Manager Tai-De Li at email@example.com for further information.