Field Emission Scanning Electron Microscope (FE-SEM)

photo: FEI Scanning Electron Microscope

The FEI Nova NanoSEM™ is a high resolution scanning electron microscope intended for sample characterization.

Contacts

  • Maya Narayanan Nair, Ph.D.
    Research Assistant Professor, Nanoscience Initiative
    Facility Staff, Nanofabrication Facility, Surface Science Facility
    mnair@gc.cuny.edu

Manufacturer / Model

FEI / Nova NanoSEM 450

Facility

Nanofabrication Facility

Keywords

metrology