![photo: FEI Scanning Electron Microscope](https://asrc.gc.cuny.edu/wp-content/uploads/media/instruments/field-emission-scanning-electron-microscope-fe-sem/nanofab-metrology-sem.jpg)
Field Emission Scanning Electron Microscope (FE-SEM)
![photo: FEI Scanning Electron Microscope](https://asrc.gc.cuny.edu/wp-content/uploads/media/instruments/field-emission-scanning-electron-microscope-fe-sem/nanofab-metrology-sem.jpg)
The FEI Nova NanoSEM™ is a high resolution scanning electron microscope intended for sample characterization.
Contacts
- Maya Narayanan Nair, Ph.D.
Research Assistant Professor, Nanoscience Initiative
Facility Staff, Nanofabrication Facility, Surface Science Facility
mnair@gc.cuny.edu